Three-configurational surface magneto-optical Kerr effect measurement system for an ultrahigh vacuum in situ study of ultrathin magnetic films
Lee, J.-W. ; Jeong, J.-R. ; Kim, D.-H. ; Ahn, J. S. ; Kim, J. ; Shin, S.-C.
[S.l.] : American Institute of Physics (AIP)
Published 2000
[S.l.] : American Institute of Physics (AIP)
Published 2000
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
We have constructed a three-configurational surface magneto-optical Kerr effect system, which provides the simultaneous measurements of the "polar," "longitudinal," and "transverse" Kerr hysteresis loops at the position where deposition is carried out in an ultrahigh vacuum growth chamber. The present system enables in situ three-dimensional vectorial studies of ultrathin film magnetism with a submonolayer sensitivity. We present three-configurational hysteresis loops measured during the growth of Co films on Pd(111), glass, and Pd/glass substrates. © 2000 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |