Three-configurational surface magneto-optical Kerr effect measurement system for an ultrahigh vacuum in situ study of ultrathin magnetic films - Lee, J.-W.; Jeong, J.-R.; Kim, D.-H.; Ahn, J. S.; Kim, J.; Shin, S.-C. (American Institute of Physics (AIP), 2000)
http://dx.doi.org/10.1063/1.1310346
Keywords: U; ZN