APA (7th ed.) Citation

Lee, J., Jeong, J., Kim, D., Ahn, J. S., Kim, J., & Shin, S. (2000). Three-configurational surface magneto-optical Kerr effect measurement system for an ultrahigh vacuum in situ study of ultrathin magnetic films. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Lee, J.-W, J.-R Jeong, D.-H Kim, J. S. Ahn, J. Kim, and S.-C Shin. Three-configurational Surface Magneto-optical Kerr Effect Measurement System for an Ultrahigh Vacuum in Situ Study of Ultrathin Magnetic Films. [S.l.]: American Institute of Physics (AIP), 2000.

MLA (9th ed.) Citation

Lee, J.-W, et al. Three-configurational Surface Magneto-optical Kerr Effect Measurement System for an Ultrahigh Vacuum in Situ Study of Ultrathin Magnetic Films. American Institute of Physics (AIP), 2000.