Hot carrier stress effects in p-MOSFETs: physical effects relevant for circuit operation

Weber, W. ; Brox, M. ; Schwerin, A.v. ; Thewes, R.

Amsterdam : Elsevier

ISSN:	0167-9317
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Electrical Engineering, Measurement and Control Technology
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0167-9317(93)90168-5