Weber, W., Brox, M., Schwerin, A., & Thewes, R. Hot carrier stress effects in p-MOSFETs: Physical effects relevant for circuit operation. Elsevier.
Chicago Style (17th ed.) CitationWeber, W., M. Brox, A.v Schwerin, and R. Thewes. Hot Carrier Stress Effects in P-MOSFETs: Physical Effects Relevant for Circuit Operation. Amsterdam: Elsevier.
MLA (9th ed.) CitationWeber, W., et al. Hot Carrier Stress Effects in P-MOSFETs: Physical Effects Relevant for Circuit Operation. Elsevier.
Warning: These citations may not always be 100% accurate.