Sensitivity measurements of a microchannel plate intensified x-ray detector in the 100–1500 eV photon energy range (abstract) : Proceedings of the 12th topical conference on high temperature plasma diagnostics

1089-7623

AIP Digital Archive

Physics

Electrical Engineering, Measurement and Control Technology

Microchannel plate intensified (MPI) x-ray detectors are commonly used for imaging and spectral measurements in the 100–1500 eV photon energy range. Using a laser-produced plasma x-ray source, we measured the integrated detector response versus incident x-ray intensity and the relative efficiency versus photon energy of a MPI x-ray detector. Two identical 2000 lines/mm transmission grating spectrometers simultaneously record broadband plasma source emission from a tantalum target. The relative efficiency was determined by comparing the spectrum recorded with an absolutely calibrated x-ray CCD reference detector on one spectrometer to the spectrum recorded with a MPI x-ray detector on the other spectrometer. The integrated detector response versus incident x-ray intensity was measured by simultaneously illuminating the CCD reference detector and the MPI detector with step-wedge-filtered magnesium plasma emission. The aluminum step wedge x-ray filters pass the 1s–2p emission lines of H-like Mg at 1470 eV and the 1s2–1s2p emission lines of He-like Mg at 1350 eV, and provide a four order of magnitude range in incident intensity on the detectors.© 1999 American Institute of Physics.

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