Ruggles, L. E., Porter, J. L., Simpson, W. W., & Vargas, M. F. (1999). Sensitivity measurements of a microchannel plate intensified x-ray detector in the 100–1500 eV photon energy range (abstract): Proceedings of the 12th topical conference on high temperature plasma diagnostics. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationRuggles, L. E., J. L. Porter, W. W. Simpson, and M. F. Vargas. Sensitivity Measurements of a Microchannel Plate Intensified X-ray Detector in the 100–1500 EV Photon Energy Range (abstract): Proceedings of the 12th Topical Conference on High Temperature Plasma Diagnostics. [S.l.]: American Institute of Physics (AIP), 1999.
MLA (9th ed.) CitationRuggles, L. E., et al. Sensitivity Measurements of a Microchannel Plate Intensified X-ray Detector in the 100–1500 EV Photon Energy Range (abstract): Proceedings of the 12th Topical Conference on High Temperature Plasma Diagnostics. American Institute of Physics (AIP), 1999.