Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x
Frenkel, A. ; Clausen, E. ; Chang, C. C. ; Venkatesan, T. ; Lin, P. S. D. ; Wu, X. D. ; Inam, A. ; Lalevic, B.
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
| ISSN: |
1077-3118
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films.
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| Type of Medium: |
Electronic Resource
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| URL: |
| _version_ | 1798289632525287424 |
|---|---|
| autor | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. |
| autorsonst | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. |
| book_url | http://dx.doi.org/10.1063/1.101620 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLZ218296231 |
| issn | 1077-3118 |
| journal_name | Applied Physics Letters |
| materialart | 1 |
| notes | We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films. |
| package_name | American Institute of Physics (AIP) |
| publikationsjahr_anzeige | 1989 |
| publikationsjahr_facette | 1989 |
| publikationsjahr_intervall | 8014:1985-1989 |
| publikationsjahr_sort | 1989 |
| publikationsort | Woodbury, NY |
| publisher | American Institute of Physics (AIP) |
| reference | 55 (1989), S. 911-913 |
| search_space | articles |
| shingle_author_1 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. |
| shingle_author_2 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. |
| shingle_author_3 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. |
| shingle_author_4 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. |
| shingle_catch_all_1 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_2 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_3 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_4 | Frenkel, A. Clausen, E. Chang, C. C. Venkatesan, T. Lin, P. S. D. Wu, X. D. Inam, A. Lalevic, B. Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_title_1 | Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x |
| shingle_title_2 | Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x |
| shingle_title_3 | Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x |
| shingle_title_4 | Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x |
| sigel_instance_filter | dkfz geomar wilbert ipn albert |
| source_archive | AIP Digital Archive |
| timestamp | 2024-05-06T08:03:55.627Z |
| titel | Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x |
| titel_suche | Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x |
| topic | U |
| uid | nat_lic_papers_NLZ218296231 |