Imaging of current-induced superconducting-resistive transitions by scanning electron microscopy in laser-deposited superconducting thin films of Y1Ba2Cu3O7−x
Frenkel, A. ; Clausen, E. ; Chang, C. C. ; Venkatesan, T. ; Lin, P. S. D. ; Wu, X. D. ; Inam, A. ; Lalevic, B.
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
Woodbury, NY : American Institute of Physics (AIP)
Published 1989
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
We have investigated the transport current-induced resistive transitions in predominantly c-axis oriented crystalline Y1Ba2Cu3O7−x superconducting thin films with scanning electron microscopic (SEM) imaging and its correlation with dc current-voltage (I-V) measurements. We find that there is a nonlinear gradual transition region in the I-V curves that is caused by macroscopic effects (current "crowding'', substrate defects, film thickness variation, etc.) and by microscopic dissipation effects. At a high current there is an abrupt transition to the normal state in the I-V curve due to Joule heating. The SEM mapping provides a direct image of the above effects and is useful for characterization and study of fundamental transport properties of high Tc thin films.
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| Type of Medium: |
Electronic Resource
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| URL: |