Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes
Prasad, K. V. R. ; Varma, K. B. R. ; Raju, A. R. ; Satyalakshmi, K. M. ; Mallya, R. M. ; Hegde, M. S.
Woodbury, NY : American Institute of Physics (AIP)
Published 1993
Woodbury, NY : American Institute of Physics (AIP)
Published 1993
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c-axis oriented BVO growth. The dielectric constant, εr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (εr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K.
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| Type of Medium: |
Electronic Resource
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| URL: |
| _version_ | 1798289623318790144 |
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| autor | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. |
| autorsonst | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. |
| book_url | http://dx.doi.org/10.1063/1.110641 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLZ218221592 |
| issn | 1077-3118 |
| journal_name | Applied Physics Letters |
| materialart | 1 |
| notes | Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c-axis oriented BVO growth. The dielectric constant, εr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (εr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K. |
| package_name | American Institute of Physics (AIP) |
| publikationsjahr_anzeige | 1993 |
| publikationsjahr_facette | 1993 |
| publikationsjahr_intervall | 8009:1990-1994 |
| publikationsjahr_sort | 1993 |
| publikationsort | Woodbury, NY |
| publisher | American Institute of Physics (AIP) |
| reference | 63 (1993), S. 1898-1900 |
| search_space | articles |
| shingle_author_1 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. |
| shingle_author_2 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. |
| shingle_author_3 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. |
| shingle_author_4 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. |
| shingle_catch_all_1 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c-axis oriented BVO growth. The dielectric constant, εr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (εr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_2 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c-axis oriented BVO growth. The dielectric constant, εr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (εr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_3 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c-axis oriented BVO growth. The dielectric constant, εr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (εr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_catch_all_4 | Prasad, K. V. R. Varma, K. B. R. Raju, A. R. Satyalakshmi, K. M. Mallya, R. M. Hegde, M. S. Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c-axis oriented BVO growth. The dielectric constant, εr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (εr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K. 1077-3118 10773118 American Institute of Physics (AIP) |
| shingle_title_1 | Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes |
| shingle_title_2 | Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes |
| shingle_title_3 | Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes |
| shingle_title_4 | Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes |
| sigel_instance_filter | dkfz geomar wilbert ipn albert |
| source_archive | AIP Digital Archive |
| timestamp | 2024-05-06T08:03:46.876Z |
| titel | Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes |
| titel_suche | Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes |
| topic | U |
| uid | nat_lic_papers_NLZ218221592 |