An experimental study of instability in inorganic gate ISFETs

Cui, C. ; Cheung, P.W. ; Yee, S. ; Muller, R.

Amsterdam : Elsevier

ISSN:	0925-4005
Source:	Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:	Chemistry and Pharmacology Electrical Engineering, Measurement and Control Technology
Type of Medium:	Electronic Resource
URL:	http://linkinghub.elsevier.com/retrieve/pii/0925-4005(90)80242-R