Si/Ti/TiB"2/Al structures investigated as contacts in microelectronic devices
Larsson, T. ; Wennstrom, U. ; Norstrom, H. ; Blom, H.-O. ; Berg, S. ; Engstrom, I.
Amsterdam : Elsevier
Amsterdam : Elsevier
| ISSN: |
0038-1101
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|---|---|
| Source: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
|
| Topics: |
Electrical Engineering, Measurement and Control Technology
Physics
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| Type of Medium: |
Electronic Resource
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| URL: |