Sharp, vertical-walled tips for SFM imaging of steep or soft samples

Keller, D. ; Deputy, D. ; Alduino, A. ; Luo, K.

Amsterdam : Elsevier
ISSN:
0304-3991
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
Natural Sciences in General
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0304-3991(92)90470-5