Dual ion beam irradiation system interfaced with a transmission electron microscope and the observation of defect evolution in Ni during irradiation
| ISSN: |
0304-3991
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|---|---|
| Source: |
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
|
| Topics: |
Electrical Engineering, Measurement and Control Technology
Natural Sciences in General
Physics
|
| Type of Medium: |
Electronic Resource
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| URL: |