Ishikawa, N., & Furuya, K. Dual ion beam irradiation system interfaced with a transmission electron microscope and the observation of defect evolution in Ni during irradiation. Elsevier.
Chicago Style (17th ed.) CitationIshikawa, N., and K. Furuya. Dual Ion Beam Irradiation System Interfaced with a Transmission Electron Microscope and the Observation of Defect Evolution in Ni During Irradiation. Amsterdam: Elsevier.
MLA (9th ed.) CitationIshikawa, N., and K. Furuya. Dual Ion Beam Irradiation System Interfaced with a Transmission Electron Microscope and the Observation of Defect Evolution in Ni During Irradiation. Elsevier.
Warning: These citations may not always be 100% accurate.