Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$
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1434-6036
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| Source: |
Springer Online Journal Archives 1860-2000
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| Topics: |
Physics
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| Notes: |
Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ .
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| Type of Medium: |
Electronic Resource
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| URL: |
| _version_ | 1798296124725919744 |
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| autor | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. |
| autorsonst | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. |
| book_url | http://dx.doi.org/10.1140/epjb/e2004-00103-4 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLM189650613 |
| iqvoc_descriptor_title | iqvoc_00000708:analysis |
| issn | 1434-6036 |
| journal_name | The European physical journal |
| materialart | 1 |
| notes | Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ . |
| package_name | Springer |
| publikationsjahr_anzeige | 2004 |
| publikationsjahr_facette | 2004 |
| publikationsjahr_intervall | 7999:2000-2004 |
| publikationsjahr_sort | 2004 |
| publisher | Springer |
| reference | 38 (2004), S. 93-98 |
| search_space | articles |
| shingle_author_1 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. |
| shingle_author_2 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. |
| shingle_author_3 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. |
| shingle_author_4 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. |
| shingle_catch_all_1 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ . 1434-6036 14346036 Springer |
| shingle_catch_all_2 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ . 1434-6036 14346036 Springer |
| shingle_catch_all_3 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ . 1434-6036 14346036 Springer |
| shingle_catch_all_4 | Welling, M. S. Aegerter, C. M. Wijngaarden, R. J. Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ . 1434-6036 14346036 Springer |
| shingle_title_1 | Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ |
| shingle_title_2 | Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ |
| shingle_title_3 | Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ |
| shingle_title_4 | Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ |
| sigel_instance_filter | dkfz geomar wilbert ipn albert fhp |
| source_archive | Springer Online Journal Archives 1860-2000 |
| timestamp | 2024-05-06T09:47:06.927Z |
| titel | Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ |
| titel_suche | Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$ |
| topic | U |
| uid | nat_lic_papers_NLM189650613 |