Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$
| ISSN: |
1434-6036
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| Source: |
Springer Online Journal Archives 1860-2000
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| Topics: |
Physics
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| Notes: |
Abstract. The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent $\alpha = 0.75(6)$ . The growth exponent of the profiles is $\beta = 0.7(1)$ .
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| Type of Medium: |
Electronic Resource
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| URL: |