Decoupling Carrier Concentration and Electron-Phonon Coupling in Oxide Heterostructures Observed with Resonant Inelastic X-Ray Scattering
D. Meyers, Ken Nakatsukasa, Sai Mu, Lin Hao, Junyi Yang, Yue Cao, G. Fabbris, Hu Miao, J. Pelliciari, D. McNally, M. Dantz, E. Paris, E. Karapetrova, Yongseong Choi, D. Haskel, P. Shafer, E. Arenholz, Thorsten Schmitt, Tom Berlijn, S. Johnston, Jian Liu, and M. P. M. Dean
American Physical Society (APS)
Published 2018
American Physical Society (APS)
Published 2018
Publication Date: |
2018-12-08
|
---|---|
Publisher: |
American Physical Society (APS)
|
Print ISSN: |
0031-9007
|
Electronic ISSN: |
1079-7114
|
Topics: |
Physics
|
Keywords: |
Condensed Matter: Electronic Properties, etc.
|
Published by: |