Decoupling Carrier Concentration and Electron-Phonon Coupling in Oxide Heterostructures Observed with Resonant Inelastic X-Ray Scattering - D. Meyers, Ken Nakatsukasa, Sai Mu, Lin Hao, Junyi Yang, Yue Cao, G. Fabbris, Hu Miao, J. Pelliciari, D. McNally, M. Dantz, E. Paris, E. Karapetrova, Yongseong Choi, D. Haskel, P. Shafer, E. Arenholz, Thorsten Schmitt, Tom Berlijn, S. Johnston, Jian Liu; M. P. M. Dean (American Physical Society (APS), 2018)
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