ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$
W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen
American Physical Society (APS)
Published 2018
American Physical Society (APS)
Published 2018
Publication Date: |
2018-09-14
|
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Publisher: |
American Physical Society (APS)
|
Print ISSN: |
1098-0121
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Electronic ISSN: |
1095-3795
|
Topics: |
Physics
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Keywords: |
Electronic structure and strongly correlated systems
|
Published by: |
_version_ | 1836399049483223040 |
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autor | W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen |
beschreibung | Author(s): W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen Hidden order in URu 2 Si 2 has remained a mystery that is now entering its fourth decade. The importance of resolving the nature of the hidden order has stimulated extensive research. Here we present a detailed characterization of different surface terminations in URu 2 Si 2 by angle-resolved photoemissio... [Phys. Rev. B 98, 115121] Published Thu Sep 13, 2018 |
citation_standardnr | 6332301 |
datenlieferant | ipn_articles |
feed_id | 52538 |
feed_publisher | American Physical Society (APS) |
feed_publisher_url | http://www.aps.org/ |
insertion_date | 2018-09-14 |
journaleissn | 1095-3795 |
journalissn | 1098-0121 |
publikationsjahr_anzeige | 2018 |
publikationsjahr_facette | 2018 |
publikationsjahr_intervall | 7984:2015-2019 |
publikationsjahr_sort | 2018 |
publisher | American Physical Society (APS) |
quelle | Physical Review B |
relation | http://link.aps.org/doi/10.1103/PhysRevB.98.115121 |
schlagwort | Electronic structure and strongly correlated systems |
search_space | articles |
shingle_author_1 | W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen |
shingle_author_2 | W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen |
shingle_author_3 | W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen |
shingle_author_4 | W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen |
shingle_catch_all_1 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ Electronic structure and strongly correlated systems Author(s): W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen Hidden order in URu 2 Si 2 has remained a mystery that is now entering its fourth decade. The importance of resolving the nature of the hidden order has stimulated extensive research. Here we present a detailed characterization of different surface terminations in URu 2 Si 2 by angle-resolved photoemissio... [Phys. Rev. B 98, 115121] Published Thu Sep 13, 2018 W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen American Physical Society (APS) 1098-0121 10980121 1095-3795 10953795 |
shingle_catch_all_2 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ Electronic structure and strongly correlated systems Author(s): W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen Hidden order in URu 2 Si 2 has remained a mystery that is now entering its fourth decade. The importance of resolving the nature of the hidden order has stimulated extensive research. Here we present a detailed characterization of different surface terminations in URu 2 Si 2 by angle-resolved photoemissio... [Phys. Rev. B 98, 115121] Published Thu Sep 13, 2018 W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen American Physical Society (APS) 1098-0121 10980121 1095-3795 10953795 |
shingle_catch_all_3 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ Electronic structure and strongly correlated systems Author(s): W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen Hidden order in URu 2 Si 2 has remained a mystery that is now entering its fourth decade. The importance of resolving the nature of the hidden order has stimulated extensive research. Here we present a detailed characterization of different surface terminations in URu 2 Si 2 by angle-resolved photoemissio... [Phys. Rev. B 98, 115121] Published Thu Sep 13, 2018 W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen American Physical Society (APS) 1098-0121 10980121 1095-3795 10953795 |
shingle_catch_all_4 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ Electronic structure and strongly correlated systems Author(s): W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen Hidden order in URu 2 Si 2 has remained a mystery that is now entering its fourth decade. The importance of resolving the nature of the hidden order has stimulated extensive research. Here we present a detailed characterization of different surface terminations in URu 2 Si 2 by angle-resolved photoemissio... [Phys. Rev. B 98, 115121] Published Thu Sep 13, 2018 W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen American Physical Society (APS) 1098-0121 10980121 1095-3795 10953795 |
shingle_title_1 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ |
shingle_title_2 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ |
shingle_title_3 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ |
shingle_title_4 | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ |
timestamp | 2025-06-30T23:36:47.700Z |
titel | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ |
titel_suche | ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ |
topic | U |
uid | ipn_articles_6332301 |