ARPES/STM study of the surface terminations and $5f$-electron character in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$

W. Zhang, H. Y. Lu, D. H. Xie, W. Feng, S. Y. Tan, Y. Liu, X. G. Zhu, Y. Zhang, Q. Q. Hao, Y. B. Huang, X. C. Lai, and Q. Y. Chen
American Physical Society (APS)
Published 2018