Precision phase measurement with short tone burst signals in acoustic microscopy
Liang, K. K. ; Bennett, S. D. ; Kino, G. S.
[S.l.] : American Institute of Physics (AIP)
Published 1986
[S.l.] : American Institute of Physics (AIP)
Published 1986
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
|
| Notes: |
A new phase measurement system based on a sychronous detection scheme is described. It is capable of yielding high precision phase data with very short tone bursts. A theoretical analysis of the system is given and system performance characteristics are also discussed. This phase measurement technique is especially suited for acoustic microscopy applications. Examples in material characterization and surface topography mapping are presented.
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| Type of Medium: |
Electronic Resource
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| URL: |