Ultrahigh-vacuum system for surface studies using high-energy ion scattering and x-ray photoemission spectroscopy
Smith, R. J. ; Whang, C. N. ; Mingde, Xu ; Worthington, M. ; Hennessy, C. ; Kim, M. ; Holland, N.
[S.l.] : American Institute of Physics (AIP)
Published 1987
[S.l.] : American Institute of Physics (AIP)
Published 1987
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
We describe a new ultrahigh-vacuum facility which is being used for studies of solid surfaces. The target chamber is attached via a differentially pumped beamline to a 2-MV Van de Graaff accelerator, and includes: (1) instrumentation for high-energy ion backscattering and channeling studies and nuclear reaction analysis, (2) a 100-mm radius hemispherical analyzer for photoemission studies, and (3) low-energy electron diffraction (LEED) optics.
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| Type of Medium: |
Electronic Resource
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| URL: |