High performance x-ray area detector suitable for small-angle scattering, crystallographic, and kinetic studies

Widom, J. ; Feng, H.-P.

[S.l.] : American Institute of Physics (AIP)
Published 1989
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
Electrical Engineering, Measurement and Control Technology
Notes:
An x-ray area detector has been constructed that has the following capabilities: lower noise and/or higher spatial resolution than previous opto-electronic designs; higher spatial resolution and no significant countrate limitations as compared to multiwire designs; and capability of acquiring millisecond- or microsecond-wide snapshots of a kinetically evolving x-ray pattern. An important feature of the present detector is that all key components are commercially produced; this detector can readily be duplicated in other laboratories.
Type of Medium:
Electronic Resource
URL: