Low-temperature ultrahigh-vacuum scanning tunneling microscope
Lang, C. A. ; Dovek, M. M. ; Quate, C. F.
[S.l.] : American Institute of Physics (AIP)
Published 1989
[S.l.] : American Institute of Physics (AIP)
Published 1989
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
We describe a multipurpose scanning tunneling microscope designed to operate in ultrahigh vacuum as well as in air, over a range extending from room temperature to liquid-nitrogen temperatures. It is a single-tube scanner design with a differential flexing approach mechanism mounted on a vibration isolation stack. The instrument features a novel in situ tip and sample exchange mechanism for extended operation under vacuum. A unique characteristic is that the vacuum chamber and all components with the exception of the gas-cooled sample holder are at room temperature. We present preliminary data taken with this instrument, demonstrating atomic resolution constant current, constant height, and multiple-bias imaging, gap-modulated current-voltage spectroscopy or simultaneous topography, and work function measurements, as well as lithography on the surfaces of graphite, Au(111) on mica, and GaAs(110).
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| Type of Medium: |
Electronic Resource
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| URL: |