Edge effect correction for small planar Langmuir probes
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
|
| Notes: |
One problem inherent in the use of small planar Langmuir probes to analyze low-density plasma is expansion of the space-charge sheath with increased probe potential due to the departure from planarity caused by a nonnegligible sheath edge. Experimental evidence showing the existence of significant edge effects in the ion saturation region of the characteristic obtained from such probes is presented. The extra ion current ΔI+ collected as a result is shown to depend on the (negative) probe potential V according to the empirical relation ΔI+∝V0.75. A theoretical justification for this is obtained. Finally, the effectiveness of the technique in eliminating the edge effect for this type of probe is demonstrated by the equivalence of ion and electron densities measured in a helium discharge.
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| Type of Medium: |
Electronic Resource
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| URL: |
| _version_ | 1798289706377543680 |
|---|---|
| autor | Johnson, J. D. Holmes, A. J. T. |
| autorsonst | Johnson, J. D. Holmes, A. J. T. |
| book_url | http://dx.doi.org/10.1063/1.1141849 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLZ219501343 |
| issn | 1089-7623 |
| journal_name | Review of Scientific Instruments |
| materialart | 1 |
| notes | One problem inherent in the use of small planar Langmuir probes to analyze low-density plasma is expansion of the space-charge sheath with increased probe potential due to the departure from planarity caused by a nonnegligible sheath edge. Experimental evidence showing the existence of significant edge effects in the ion saturation region of the characteristic obtained from such probes is presented. The extra ion current ΔI+ collected as a result is shown to depend on the (negative) probe potential V according to the empirical relation ΔI+∝V0.75. A theoretical justification for this is obtained. Finally, the effectiveness of the technique in eliminating the edge effect for this type of probe is demonstrated by the equivalence of ion and electron densities measured in a helium discharge. |
| package_name | American Institute of Physics (AIP) |
| publikationsjahr_anzeige | 1990 |
| publikationsjahr_facette | 1990 |
| publikationsjahr_intervall | 8009:1990-1994 |
| publikationsjahr_sort | 1990 |
| publikationsort | [S.l.] |
| publisher | American Institute of Physics (AIP) |
| reference | 61 (1990), S. 2628-2631 |
| search_space | articles |
| shingle_author_1 | Johnson, J. D. Holmes, A. J. T. |
| shingle_author_2 | Johnson, J. D. Holmes, A. J. T. |
| shingle_author_3 | Johnson, J. D. Holmes, A. J. T. |
| shingle_author_4 | Johnson, J. D. Holmes, A. J. T. |
| shingle_catch_all_1 | Johnson, J. D. Holmes, A. J. T. Edge effect correction for small planar Langmuir probes One problem inherent in the use of small planar Langmuir probes to analyze low-density plasma is expansion of the space-charge sheath with increased probe potential due to the departure from planarity caused by a nonnegligible sheath edge. Experimental evidence showing the existence of significant edge effects in the ion saturation region of the characteristic obtained from such probes is presented. The extra ion current ΔI+ collected as a result is shown to depend on the (negative) probe potential V according to the empirical relation ΔI+∝V0.75. A theoretical justification for this is obtained. Finally, the effectiveness of the technique in eliminating the edge effect for this type of probe is demonstrated by the equivalence of ion and electron densities measured in a helium discharge. 1089-7623 10897623 American Institute of Physics (AIP) |
| shingle_catch_all_2 | Johnson, J. D. Holmes, A. J. T. Edge effect correction for small planar Langmuir probes One problem inherent in the use of small planar Langmuir probes to analyze low-density plasma is expansion of the space-charge sheath with increased probe potential due to the departure from planarity caused by a nonnegligible sheath edge. Experimental evidence showing the existence of significant edge effects in the ion saturation region of the characteristic obtained from such probes is presented. The extra ion current ΔI+ collected as a result is shown to depend on the (negative) probe potential V according to the empirical relation ΔI+∝V0.75. A theoretical justification for this is obtained. Finally, the effectiveness of the technique in eliminating the edge effect for this type of probe is demonstrated by the equivalence of ion and electron densities measured in a helium discharge. 1089-7623 10897623 American Institute of Physics (AIP) |
| shingle_catch_all_3 | Johnson, J. D. Holmes, A. J. T. Edge effect correction for small planar Langmuir probes One problem inherent in the use of small planar Langmuir probes to analyze low-density plasma is expansion of the space-charge sheath with increased probe potential due to the departure from planarity caused by a nonnegligible sheath edge. Experimental evidence showing the existence of significant edge effects in the ion saturation region of the characteristic obtained from such probes is presented. The extra ion current ΔI+ collected as a result is shown to depend on the (negative) probe potential V according to the empirical relation ΔI+∝V0.75. A theoretical justification for this is obtained. Finally, the effectiveness of the technique in eliminating the edge effect for this type of probe is demonstrated by the equivalence of ion and electron densities measured in a helium discharge. 1089-7623 10897623 American Institute of Physics (AIP) |
| shingle_catch_all_4 | Johnson, J. D. Holmes, A. J. T. Edge effect correction for small planar Langmuir probes One problem inherent in the use of small planar Langmuir probes to analyze low-density plasma is expansion of the space-charge sheath with increased probe potential due to the departure from planarity caused by a nonnegligible sheath edge. Experimental evidence showing the existence of significant edge effects in the ion saturation region of the characteristic obtained from such probes is presented. The extra ion current ΔI+ collected as a result is shown to depend on the (negative) probe potential V according to the empirical relation ΔI+∝V0.75. A theoretical justification for this is obtained. Finally, the effectiveness of the technique in eliminating the edge effect for this type of probe is demonstrated by the equivalence of ion and electron densities measured in a helium discharge. 1089-7623 10897623 American Institute of Physics (AIP) |
| shingle_title_1 | Edge effect correction for small planar Langmuir probes |
| shingle_title_2 | Edge effect correction for small planar Langmuir probes |
| shingle_title_3 | Edge effect correction for small planar Langmuir probes |
| shingle_title_4 | Edge effect correction for small planar Langmuir probes |
| sigel_instance_filter | dkfz geomar wilbert ipn albert |
| source_archive | AIP Digital Archive |
| timestamp | 2024-05-06T08:05:03.712Z |
| titel | Edge effect correction for small planar Langmuir probes |
| titel_suche | Edge effect correction for small planar Langmuir probes |
| topic | U ZN |
| uid | nat_lic_papers_NLZ219501343 |