Second order correction in cavity constitutive parameter measurements with application to anisotropic ferrites
Moore, R. L. ; Thompson, M. C. ; Robbins, T. S.
[S.l.] : American Institute of Physics (AIP)
Published 1990
[S.l.] : American Institute of Physics (AIP)
Published 1990
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
An analysis is presented to calculate scalar permittivity and tensor permeability for ferrite materials from waveguide transmission cavity data. A correct measurement of the permittivity of ferrites and other high dielectric constant materials, requires an extension of current techniques to a second-order perturbational analysis. This second-order correction offsets an apparent frequency dependent dielectric behavior measured during a multimode cavity measurement. The analysis implies that dimensions of ferrite samples to be used in various waveguides (X-Ka bands) must be reduced to a near 0.015-in. cross-sections to eliminate a coupling of permittivity and permeability measurements.
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| Type of Medium: |
Electronic Resource
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| URL: |