A tunneling instrument for angle resolved tunneling spectroscopy

Suzuki, M. ; Fujii, T. ; Miyashita, M. ; Onuki, T. ; Enomoto, H. ; Ozaki, H.

[S.l.] : American Institute of Physics (AIP)
Published 1991
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
Electrical Engineering, Measurement and Control Technology
Notes:
A new tunneling instrument has been developed to observe the anisotropy of the Fermi surface. This instrument has two advantageous mechanisms over the conventional scanning tunneling microscope (STM); a tilt mechanism to keep two crystals parallel to each other and a rotation mechanism of the proven crystal over the sample crystal. We have evaluated its performance.
Type of Medium:
Electronic Resource
URL: