A high-resolution x-ray fluorescence spectrometer for near-edge absorption studies : Proceedings of the 4th international conference on synchrotron radiation instructumentation
Stojanoff, V. ; Hämäläinen, K. ; Siddons, D. P. ; Hastings, J. B. ; Berman, L. E. ; Cramer, S. ; Smith, G.
[S.l.] : American Institute of Physics (AIP)
Published 1992
[S.l.] : American Institute of Physics (AIP)
Published 1992
| ISSN: |
1089-7623
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
A high-resolution fluorescence spectrometer using a Johann geometry in a backscattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high-resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near-edge absorption spectrum of dysprosium nitrate.
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| Type of Medium: |
Electronic Resource
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| URL: |