Dynamic observation of the secondary recrystallization process at high temperatures in grain-oriented silicon steel using synchrotron x-radiation : Proceedings of the 4th international conference on synchrotron radiation instrumentation
Kawasaki, K. ; Iwasaki, H. ; Kawata, H. ; Nose, K.
[S.l.] : American Institute of Physics (AIP)
Published 1992
[S.l.] : American Institute of Physics (AIP)
Published 1992
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
Taking advantage of the high brightness of synchrotron radiation, changes in the microstructure of silicon steel sheets in the secondary recrystallization process at 1233 K were measured by consecutive recording of the pole figure using a newly developed system consisting of the x-ray diffractometer and the translating imaging plate and by real-time observation of Laue topographic pattern using two kinds of TV camera. It was shown that {110} 〈001〉 oriented grains grew, after a certain incubation period of time, at a burst and occupied most of the sample volume. There was an appreciable anisotropy in the migration of the recrystallization front. When tensile strain was applied to the sample, growth of the {110} 〈001〉 oriented grains was appreciably delayed.
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| Type of Medium: |
Electronic Resource
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| URL: |