PIXE x rays: From Z=4 to Z=92 : Proceedings of the 9th topical conference on high temperature plasma diagnostics
Li, C. K. ; Wenzel, K. W. ; Petrasso, R. D. ; Lo, D. H. ; Coleman, J. W. ; Lierzer, J. R. ; Hsieh, E. ; Bernat, T.
[S.l.] : American Institute of Physics (AIP)
Published 1992
[S.l.] : American Institute of Physics (AIP)
Published 1992
| ISSN: |
1089-7623
|
|---|---|
| Source: |
AIP Digital Archive
|
| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
|
| Notes: |
A high-intensity, charged-particle-induced x-ray (PIXE) source has been developed for the purpose of characterizing x-ray detectors and optics, and measuring filter transmissions. With energetic proton beams up to 165 keV, intense line x radiations (0.5 A(ring)≤λ≤111 A(ring)) have been generated from the K, L, M, and N shells of elements 4≤Z≤92. The PIXE spectrum has orders-of-magnitude lower background continuum than a conventional electron beam or radioactive α-fluorescence source [C. K. Li, R. D. Petrasso, K. W. Wenzel et al. (to be published)].
|
| Type of Medium: |
Electronic Resource
|
| URL: |