The Oxford electron-beam ion trap: A device for spectroscopy of highly charged ions : Proceedings of the 5th international conference on ion sources
Silver, J. D. ; Varney, A. J. ; Margolis, H. S. ; Baird, P. E. G. ; Grant, I. P. ; Groves, P. D. ; Hallett, W. A. ; Handford, A. T. ; Hirst, P. J. ; Holmes, A. R. ; Howie, D. J. H. ; Hunt, R. A. ; Nobbs, K. A. ; Roberts, M. ; Studholme, W. ; Wark, J. S. ; Williams, M. T. ; Levine, M. A. ; Dietrich, D. D. ; Graham, W. G. ; Williams, I. D. ; O'Neil, R. ; Rose, S. J.
[S.l.] : American Institute of Physics (AIP)
Published 1994
[S.l.] : American Institute of Physics (AIP)
Published 1994
| ISSN: |
1089-7623
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
An electron-beam ion trap (EBIT) has just been completed in the Clarendon Laboratory, Oxford. The design is similar to the devices installed at the Lawrence Livermore National Laboratory. It is intended that the Oxford EBIT will be used for x-ray and UV spectroscopy of hydrogenic and helium-like ions, laser resonance spectroscopy of hydrogenic ions and measurements of dielectronic recombination cross sections, in order to test current understanding of simple highly charged ions.
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| Type of Medium: |
Electronic Resource
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| URL: |