A new electrochemical cell for atomic force microscopy

Wanless, E. J. ; Senden, T. J. ; Hyde, A. M. ; Sawkins, T. J. ; Heath, G. A.

[S.l.] : American Institute of Physics (AIP)
Published 1994
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
Electrical Engineering, Measurement and Control Technology
Notes:
Described is the design for a new electrochemical cell for in situ studies with the atomic force microscope. Improvements over presently used cells include an axially symmetric electrode geometry, large counter electrode, and the ability to incorporate a standard reference electrode close to the working electrode.
Type of Medium:
Electronic Resource
URL: