Mesh effect in a parallel-plate analyzer
Hamada, Y. ; Kawasumi, Y. ; Iguchi, H. ; Fujisawa, A. ; Abe, Y. ; Takahashi, M.
[S.l.] : American Institute of Physics (AIP)
Published 1994
[S.l.] : American Institute of Physics (AIP)
Published 1994
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
The effect of field irregularity due to the use of conducting meshes to cover holes of a lower electrode in a parallel-plate electrostatic analyzer, is experimentally and numerically investigated. Displacement of a focal point and degradation of analyzer characteristics are found in the experiment. Dependence of analyzer characteristics on wire spacing is obtained. Primary results are also confirmed by numerical analysis. Criteria for error estimation are theoretically derived and found to be consistent with the experiment.
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| Type of Medium: |
Electronic Resource
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| URL: |