A comparison of CaF2:Mn thermoluminescent dosimeter chips to aluminum and silicon x-ray calorimeters in the pulsed Hermes III environment : Proceedings of the tenth topical conference on high temperature plasma diagnostics
Fehl, D. L. ; Sujka, B. R. ; Vehar, D. W. ; Westfall, R. L. ; Lorence, L. J. ; Rice, D. A. ; Gilbert, D. W.
[S.l.] : American Institute of Physics (AIP)
Published 1995
[S.l.] : American Institute of Physics (AIP)
Published 1995
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1089-7623
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
Hermes III is a pulsed power, Bremsstrahlung simulator used for radiation-hardness testing of electronics components [19-MeV spectrum, 20-ns pulse duration, and typical doses (silicon) ≤100 krad (1 kGy)]. CaF2:Mn thermoluminescent dosimeter chips (TLDs) have been compared to a set of x-ray calorimeters in the Hermes III environment for doses between 10–75 krad. Similar to a design reported by Murray and Attix, this set of detectors included different dosimetric materials (silicon and aluminum) and two independent temperature sensors (thermistors and thermocouples). The electronic recording system was also updated. The average disagreement between TLDs and calorimeters was 1%–3%. Radiation transport calculations, however, suggest a possible bias of 4%–6% (source unknown). With the silicon calorimeter the ac bridge, which measured the resistance of thermistor temperature sensors, was extremely sensitive to EMP. © 1995 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |