ESCA microscopy beamline at ELETTRA
Casalis, L. ; Jark, W. ; Kiskinova, M. ; Lonza, D. ; Melpignano, P. ; Morris, D. ; Rosei, R. ; Savoia, A. ; Abrami, A. ; Fava, C. ; Furlan, P. ; Pugliese, R. ; Vivoda, D. ; Sandrin, G. ; Wei, F.-Q. ; Contarini, S. ; DeAngelis, L. ; Gariazzo, C. ; Nataletti, P. ; Morrison, G. R.
[S.l.] : American Institute of Physics (AIP)
Published 1995
[S.l.] : American Institute of Physics (AIP)
Published 1995
| ISSN: |
1089-7623
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
The article describes the ESCA microscopy beamline dedicated to high spatial resolution quantitative and qualitative analysis on surfaces and interfaces. The scanning microscope is constructed to work both in transmission and photoemission within the photon energy range from 200 to 1200 eV with a spatial resolution of ∼0.1 μm. A Fresnel zone plate demagnifies the photon beam to submicrometer dimensions with 109–1010 photons/s in the focus spot. A photodiode and a hemispherical electron energy analyzer are used as detectors for recording the transmitted x-rays and emitted photoelectrons, respectively. The operation modes in photoemission give the opportunity to obtain conventional energy distribution curve spectra from a microspot or a two-dimensional micrograph of the spatial distribution and local concentration of a selected element as the sample is mechanically scanned. For conductive specimen topography measurements of a selected surface area probed by SPEM are possible using a scanning tunnelling microscope. The first test images of a zone plate and an e-beam written specimen with 1 μm2 Au squares on Si have shown a spatial resolution better than 0.2 μm. © 1995 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |