Undulator test of a Bragg reflection elliptical polarizer at ∼7.1 keV : Proceedings of the 5th international conference on synchrotron radiation instrumentation
Shastri, S. D. ; Finkelstein, K. D. ; Shen, Qun ; Batterman, B. W. ; Walko, D. A.
[S.l.] : American Institute of Physics (AIP)
Published 1995
[S.l.] : American Institute of Physics (AIP)
Published 1995
| ISSN: |
1089-7623
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
A system of diffracting perfect crystals for the generation of variable, elliptically polarized x rays was tested at the Cornell High Energy Synchrotron Source under the conditions of a standard undulator source. The phase retarding optical component was a 4-bounce, Ge(220) Bragg reflection channel-cut crystal. The full polarization state of the output beam, including the circular polarization purity P3, was determined using the multiple-beam Bragg diffraction technique. In addition to measuring the optics' efficiency, the ability to scan the system in energy, while frequently reversing the circular helicity, was demonstrated at the vicinity of the Fe K edge at 7.1 keV. The setup was applied to a circular magnetic x-ray dichroism measurement. © 1995 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |