Automatic temperature-controlled helium-vapor cryostat for atom-probe field-ion microscopy studies
Van Bakel, G. P. E. M. ; Shashkov, D. A. ; Seidman, D. N.
[S.l.] : American Institute of Physics (AIP)
Published 1995
[S.l.] : American Institute of Physics (AIP)
Published 1995
| ISSN: |
1089-7623
|
|---|---|
| Source: |
AIP Digital Archive
|
| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
|
| Notes: |
An automatic temperature control mechanism was fabricated from readily available components and installed on an existing continuous flow helium-vapor cryostat as part of an atom-probe field-ion microscope. This control system eliminates tedious manual adjustment of the vapor flow rate. It is shown that the time needed to cool the cryostat from room temperature to a cryogenic temperature is reduced from 3 to 1 h. Within the 40–80 K range changes in the setpoint temperature are accommodated within 10 min. The temperature stability is better than 0.1 K. © 1995 American Institute of Physics.
|
| Type of Medium: |
Electronic Resource
|
| URL: |