An emittance–mass scanner for small-mass, low-energy beams : Proceedings of the 6th international conference on ion sources
Yuan, D. ; Jayamanna, K. ; Kuo, T. ; McDonald, M. ; Schmor, P.
[S.l.] : American Institute of Physics (AIP)
Published 1996
[S.l.] : American Institute of Physics (AIP)
Published 1996
| ISSN: |
1089-7623
|
|---|---|
| Source: |
AIP Digital Archive
|
| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
|
| Notes: |
An on-line emittance–mass scanner (EMS), with a size of 10 cm×10 cm×8 cm, has been developed for use with low energy and light ion beams (A〈40) at TRIUMF. Computerized data acquisition and procession give the rms emittances, intensities, and contour plots of each beam component. The angular resolution of the scanner is ±1.0 mrad, the maximum divergence of each component that the scanner can take is 140 mrad. Some experimental results of the measurement are given. The comparison between the contour shapes and the values of the emittance measured by both the emittance scanner and EMS is in good agreement. © 1996 American Institute of Physics.
|
| Type of Medium: |
Electronic Resource
|
| URL: |