Apparatus for small angle x-ray scattering measurements of polymer deformation
Salomons, G. J. ; Singh, M. A. ; Gupta, J. A. ; Foran, W. A. ; Clarke, J. R. ; Capel, M. S.
[S.l.] : American Institute of Physics (AIP)
Published 1996
[S.l.] : American Institute of Physics (AIP)
Published 1996
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
We present an apparatus which is capable of small-angle x-ray scattering studies of polymer deformation at strain rates ranging from 49.6 μm/s to less than 0.033 μm/s and temperatures ranging from room (≈22 °C) to 120 °C. The system also includes a load cell for measuring the force applied to the sample and a symmetric stretching system to keep the sample centered in the x-ray beam. © 1996 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |