Construction of a dual mode scanning near-field optical microscope based on a tapping mode atomic force microscope
| ISSN: |
1089-7623
|
|---|---|
| Source: |
AIP Digital Archive
|
| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
|
| Notes: |
We present the modification of a commercial tapping mode atomic force microscope into a reflection and transmission dual mode scanning near-field optical microscope. In the configuration, the normal force detection unit is replaced by a shear force detection module and an interfacing circuit. The tip-sample distance control is therefore similar to tapping mode operation. Detection of the near-field signals is based on photodiodes and the lock-in technique, and the resolutions obtained for the topography and the near-field signal are around 80 and 150 nm, respectively.© 1998 American Institute of Physics.
|
| Type of Medium: |
Electronic Resource
|
| URL: |