A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source
Warwick, T. ; Franck, K. ; Kortright, J. B. ; Meigs, G. ; Moronne, M. ; Myneni, S. ; Rotenberg, E. ; Seal, S. ; Steele, W. F.
[S.l.] : American Institute of Physics (AIP)
Published 1998
[S.l.] : American Institute of Physics (AIP)
Published 1998
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials. © 1998 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |