Atomic force microscopy of polymeric liquid films
Mate, C. Mathew ; Lorenz, Max R. ; Novotny, V. J.
College Park, Md. : American Institute of Physics (AIP)
Published 1989
College Park, Md. : American Institute of Physics (AIP)
Published 1989
| ISSN: |
1089-7690
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
Chemistry and Pharmacology
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| Notes: |
We demonstrate the use of the atomic force microscope (AFM) for studying perfluoropolyether polymer liquid films as thin as ∼20 A(ring). With the AFM we are able to measure three distinct properties of the liquid film: (1) its thickness when the thickness of liquid on the AFM tip is taken into account, (2) the meniscus force acting on the AFM tip as a function of depth into the liquid film, and (3) the topography of the liquid/air interface. All three of these measurements can be done with a very high lateral resolution, ∼1000 A(ring), demonstrating the unique capability of AFM for studying liquid films. With AFM we have observed several interesting properties of these polymeric liquid films. First films thinner than ∼300 A(ring) are fairly uniformly distributed, while films thicker than ∼300 A(ring) slowly dewet the surface. Second, by measuring the meniscus radius of liquid in a micron sized hole on the surface, we can determine the disjoining pressure in a thin liquid film.
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| Type of Medium: |
Electronic Resource
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| URL: |