Erratum: Atom- and radical-surface sticking coefficients measured using resonance-enhanced multiphoton ionization (REMPI) [J. Chem. Phys. 91, 5037 (1989)]
Robertson, Robert M. ; Rossi, Michel J.
College Park, Md. : American Institute of Physics (AIP)
Published 1989
College Park, Md. : American Institute of Physics (AIP)
Published 1989
ISSN: |
1089-7690
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Source: |
AIP Digital Archive
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Topics: |
Physics
Chemistry and Pharmacology
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Type of Medium: |
Electronic Resource
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URL: |