Capacitance and dielectric constant of Cd1−xMnxTe

Peek, D. ; Guerra Vela, C. ; Sladek, R. J.

[S.l.] : American Institute of Physics (AIP)
Published 1985
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have measured the electrical impedance of CdTe and Cd0.55Mn0.45Te crystals at temperatures between 82 and 104 K using frequencies between 20 kHz and 2.0 MHz. From the capacitance results we determined that the dielectric constant was only slightly smaller for x=0.45 than for x=0—a result important for the understanding of electromechanical coupling in Cd1−xMnxTe.
Type of Medium:
Electronic Resource
URL: