Determination of crystallographic polarity of CdTe crystals with Auger electron spectroscopy
Lu, Y.-C. ; Stahle, C. M. ; Morimoto, J. ; Bube, R. H. ; Feigelson, R. S.
[S.l.] : American Institute of Physics (AIP)
Published 1987
[S.l.] : American Institute of Physics (AIP)
Published 1987
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
The crystallographic polarity of CdTe crystals has been studied with Auger electron spectroscopy. The polarity of various surfaces could be determined by normalizing the low-energy Te (NOO) peak with the high-energy Te (MNN) peak. Upon comparing the normalized ratios from both {111} surfaces, the ratio from (111) Te surfaces was found to be about 1.3 times that from (111) Cd surfaces. The identified polarity was consistent with recent results of anomalous absorption of x rays, the convergent beam method of transmission electron microscopy, and chemical etching. Air-cleaved {110} surfaces of CdTe crystals and surfaces of pure Te crystals were studied for comparison as well.
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| Type of Medium: |
Electronic Resource
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| URL: |