New silicon-related deep broadband luminescence emission in Al0.3Ga0.7As epitaxial layers

Souza, P. ; Rao, E. V. K. ; Alexandre, F. ; Gauneau, M.

[S.l.] : American Institute of Physics (AIP)
Published 1988
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Luminescence spectra of variously silicon-doped Al0.3Ga0.7As (Al0.3Ga0.7As@B: Si) single layers grown by molecular-beam epitaxy were investigated as a function of silicon effusion-cell temperature. A correlation between silicon incorporation as a complex involving SiAs and the existence of a deep broadband emission is suggested. To achieve this, in addition to photoluminescence, Hall effect, capacitance, and secondary ion mass spectroscopy measurements were also performed.
Type of Medium:
Electronic Resource
URL: