Zvanut, M. E., Feigl, F. J., & Zook, J. D. (1988). A defect relaxation model for bias instabilities in metal-oxide-semiconductor capacitors. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationZvanut, M. E., F. J. Feigl, and J. D. Zook. A Defect Relaxation Model for Bias Instabilities in Metal-oxide-semiconductor Capacitors. [S.l.]: American Institute of Physics (AIP), 1988.
MLA (9th ed.) CitationZvanut, M. E., et al. A Defect Relaxation Model for Bias Instabilities in Metal-oxide-semiconductor Capacitors. American Institute of Physics (AIP), 1988.
Warning: These citations may not always be 100% accurate.