Magnetization study on grain-boundary precipitation in a Ni-8 at. % Sn alloy
Yao, Y. D. ; Chen, Y. Y. ; Li, T. J. ; Chuang, T. H.
[S.l.] : American Institute of Physics (AIP)
Published 1990
[S.l.] : American Institute of Physics (AIP)
Published 1990
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
The variations of the grain-boundary precipitates, the electrical resistivity, and the magnetization of a Ni-8 at. % Sn alloy have been investigated as functions of annealing temperature and annealing time. For samples annealed at 773 K, the averaged growth rate of the size of the grain-boundary precipitates is roughly 0.42 μm/h for the first 24 h; the electrical resistivity at T=10 K and the magnetization at T=10 K and H=5 kG vary monotonically with respect to the annealing time for the first 2 weeks, changing from 22.5 to 7 μΩ cm for the electrical resistivity and from 27 to 33 emu/g for the magnetization. A large tail section in the magnetization versus temperature curve was also observed in the aged samples. All these electrical and magnetic variations in the Ni-8 at. % Sn samples annealed at 773 K varied monotonically with respect to the growth of the grain-boundary precipitates.
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| Type of Medium: |
Electronic Resource
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| URL: |