Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials
Barnard, J. A. ; Tan, M. ; Waknis, A. ; Haftek, E.
[S.l.] : American Institute of Physics (AIP)
Published 1991
[S.l.] : American Institute of Physics (AIP)
Published 1991
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Periodic multilayer thin films of the form (xAl/yFe-N)n were grown by sequential dc-magnetron sputtering. The thicknesses of the individual Al and Fe-N layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm and y was varied systematically from 3 to 135 nm. Magnetic properties were studied by vibrating sample magnetometry and crystal structure by x-ray diffraction for both as-deposited and annealed films. A strong enhancement of the saturation magnetization was found in multilayers containing the thinnest Fe-N layers which was further strengthened by annealing. The coercivity was found to decline monotonically with decreasing Fe-N layer thickness in the as-deposited films. Annealing produced nonsystematic changes in coercivity. The evolution of magnetic properties with decreasing Fe-N layer thickness was correlated with complex changes in iron-nitride crystal structure. For the thinnest layers of Fe-N (less than 12 nm) the multilayers exhibited an essentially amorphous structure.
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| Type of Medium: |
Electronic Resource
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| URL: |
| _version_ | 1798289663741394944 |
|---|---|
| autor | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. |
| autorsonst | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. |
| book_url | http://dx.doi.org/10.1063/1.348055 |
| datenlieferant | nat_lic_papers |
| hauptsatz | hsatz_simple |
| identnr | NLZ218645805 |
| iqvoc_descriptor_title | iqvoc_00000092:materials |
| issn | 1089-7550 |
| journal_name | Journal of Applied Physics |
| materialart | 1 |
| notes | Periodic multilayer thin films of the form (xAl/yFe-N)n were grown by sequential dc-magnetron sputtering. The thicknesses of the individual Al and Fe-N layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm and y was varied systematically from 3 to 135 nm. Magnetic properties were studied by vibrating sample magnetometry and crystal structure by x-ray diffraction for both as-deposited and annealed films. A strong enhancement of the saturation magnetization was found in multilayers containing the thinnest Fe-N layers which was further strengthened by annealing. The coercivity was found to decline monotonically with decreasing Fe-N layer thickness in the as-deposited films. Annealing produced nonsystematic changes in coercivity. The evolution of magnetic properties with decreasing Fe-N layer thickness was correlated with complex changes in iron-nitride crystal structure. For the thinnest layers of Fe-N (less than 12 nm) the multilayers exhibited an essentially amorphous structure. |
| package_name | American Institute of Physics (AIP) |
| publikationsjahr_anzeige | 1991 |
| publikationsjahr_facette | 1991 |
| publikationsjahr_intervall | 8009:1990-1994 |
| publikationsjahr_sort | 1991 |
| publikationsort | [S.l.] |
| publisher | American Institute of Physics (AIP) |
| reference | 69 (1991), S. 5298-5300 |
| search_space | articles |
| shingle_author_1 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. |
| shingle_author_2 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. |
| shingle_author_3 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. |
| shingle_author_4 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. |
| shingle_catch_all_1 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials Periodic multilayer thin films of the form (xAl/yFe-N)n were grown by sequential dc-magnetron sputtering. The thicknesses of the individual Al and Fe-N layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm and y was varied systematically from 3 to 135 nm. Magnetic properties were studied by vibrating sample magnetometry and crystal structure by x-ray diffraction for both as-deposited and annealed films. A strong enhancement of the saturation magnetization was found in multilayers containing the thinnest Fe-N layers which was further strengthened by annealing. The coercivity was found to decline monotonically with decreasing Fe-N layer thickness in the as-deposited films. Annealing produced nonsystematic changes in coercivity. The evolution of magnetic properties with decreasing Fe-N layer thickness was correlated with complex changes in iron-nitride crystal structure. For the thinnest layers of Fe-N (less than 12 nm) the multilayers exhibited an essentially amorphous structure. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_catch_all_2 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials Periodic multilayer thin films of the form (xAl/yFe-N)n were grown by sequential dc-magnetron sputtering. The thicknesses of the individual Al and Fe-N layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm and y was varied systematically from 3 to 135 nm. Magnetic properties were studied by vibrating sample magnetometry and crystal structure by x-ray diffraction for both as-deposited and annealed films. A strong enhancement of the saturation magnetization was found in multilayers containing the thinnest Fe-N layers which was further strengthened by annealing. The coercivity was found to decline monotonically with decreasing Fe-N layer thickness in the as-deposited films. Annealing produced nonsystematic changes in coercivity. The evolution of magnetic properties with decreasing Fe-N layer thickness was correlated with complex changes in iron-nitride crystal structure. For the thinnest layers of Fe-N (less than 12 nm) the multilayers exhibited an essentially amorphous structure. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_catch_all_3 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials Periodic multilayer thin films of the form (xAl/yFe-N)n were grown by sequential dc-magnetron sputtering. The thicknesses of the individual Al and Fe-N layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm and y was varied systematically from 3 to 135 nm. Magnetic properties were studied by vibrating sample magnetometry and crystal structure by x-ray diffraction for both as-deposited and annealed films. A strong enhancement of the saturation magnetization was found in multilayers containing the thinnest Fe-N layers which was further strengthened by annealing. The coercivity was found to decline monotonically with decreasing Fe-N layer thickness in the as-deposited films. Annealing produced nonsystematic changes in coercivity. The evolution of magnetic properties with decreasing Fe-N layer thickness was correlated with complex changes in iron-nitride crystal structure. For the thinnest layers of Fe-N (less than 12 nm) the multilayers exhibited an essentially amorphous structure. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_catch_all_4 | Barnard, J. A. Tan, M. Waknis, A. Haftek, E. Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials Periodic multilayer thin films of the form (xAl/yFe-N)n were grown by sequential dc-magnetron sputtering. The thicknesses of the individual Al and Fe-N layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm and y was varied systematically from 3 to 135 nm. Magnetic properties were studied by vibrating sample magnetometry and crystal structure by x-ray diffraction for both as-deposited and annealed films. A strong enhancement of the saturation magnetization was found in multilayers containing the thinnest Fe-N layers which was further strengthened by annealing. The coercivity was found to decline monotonically with decreasing Fe-N layer thickness in the as-deposited films. Annealing produced nonsystematic changes in coercivity. The evolution of magnetic properties with decreasing Fe-N layer thickness was correlated with complex changes in iron-nitride crystal structure. For the thinnest layers of Fe-N (less than 12 nm) the multilayers exhibited an essentially amorphous structure. 1089-7550 10897550 American Institute of Physics (AIP) |
| shingle_title_1 | Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials |
| shingle_title_2 | Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials |
| shingle_title_3 | Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials |
| shingle_title_4 | Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials |
| sigel_instance_filter | dkfz geomar wilbert ipn albert |
| source_archive | AIP Digital Archive |
| timestamp | 2024-05-06T08:04:25.237Z |
| titel | Magnetic properties and structure of Al/Fe-N periodic multilayer thin films : 35th annual conference on magnetism and magnetic materials |
| titel_suche | Magnetic properties and structure of Al/Fe-N periodic multilayer thin films 35th annual conference on magnetism and magnetic materials |
| topic | U |
| uid | nat_lic_papers_NLZ218645805 |